A method or apparatus for analyzing material composition using X-ray diffraction with intensity measurements across a 2θ range of 10-50°.

Patentradars sammanfattning

The patent document presents X-ray diffraction (XRD) analysis data showing intensity counts plotted against 2-theta angles from 10° to 50°. The figure displays a diffraction pattern with peak intensities reaching approximately 15,000 counts, suggesting crystalline phase identification or structural characterization of a material sample. This analytical technique is fundamental for determining crystal structure, phase composition, and material properties in materials science applications.

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